The president of an Iranian university and a colleague appear to have published the same microelectronics paper twice, according to allegations seen by Retraction Watch.
The articles, by Bahram Azizollah Ganji and Kamran Delfan Hemmati of Babol Noshirvani University of Technology, deal with the design of a new capacitive accelerometer with a high dynamic range and sensitivity. Both appeared online in 2020, first in the Slovenia-based Journal of Microelectronics, Electronic Components and Materials and later in the higher-impact Springer journal Microsystem Technologies. The former version has yet to be cited, according to Clarivate’s Web of Science, while the latter has been cited twice.
The editors of Microsystem Technologies were made aware of the allegations on November 16 in an email that cited “significantly identical content” in the two papers. “Pretty much the entire introduction section and almost all figures are an exact copy from” the authors’ previous article, the email stated.
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