Retraction Watch

Tracking retractions as a window into the scientific process

Duplication leads to collapse in Nondestructive Testing

without comments

Call it uncreative non-destruction. ntecover

A team from China and, it appears, Mississippi, has lost a paper in Nondestructive Testing and Evaluation for duplicate publication.

Here’s the notice (a PDF):

The following article, which was published online by Taylor & Francis on 19th December 2011, has been retracted from publication in Nondestructive Testing and Evaluation.

JianWei Li, MinQiang Xu, MingXiu Xu and JianCheng Leng, 2011. Investigation of the variation in surface magnetic field induced by cyclic tensile-compressive stress. Nondestructive Testing and Evaluation, DOI: 10.1080/10589759.2011.610796

This article has been found to reproduce content to a high degree of similarity, without appropriate attribution or acknowledgement by the author, from the following original article:

JianWei Li, MinQiang Xu, MingXiu Xu and JianCheng Leng. Investigation of the variation in magnetic field induced by cyclic tensile-compressive stress. Insight, 53 (9), 487-490.

The journal’s policy in this respect is clear: Nondestructive Testing and Evaluation considers all manuscripts on the strict condition that they have been submitted only to Nondestructive Testing and Evaluation, that they have not been published already, nor are they under consideration for publication or in press elsewhere.

The article is withdrawn from all electronic editions.

The Insight article appeared in September 2011, three months before the retracted paper. The full name of Insight is Insight – Non-Destructive Testing and Condition Monitoring, so it’s not as if the researchers were trying to bury their double submission in a far-afield journal.

JianCheng Leng and the Xus are at the Harbin Institute of Technology. JianWei Li, a former student at Harbin and Mississippi State, appears to be a battery researcher at Ford.

  • Post a comment

    Threaded commenting powered by interconnect/it code.